The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Aug. 01, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Yoon-Kyu Jang, Yongin-si, KR;

Han-Sub Jung, Yongin-si, KR;

Chee-Hoon Lee, Incheon, KR;

Jeong-Min Park, Suwon-si, KR;

Jae-Woong Chun, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 13/00 (2006.01); H04M 1/725 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G01K 13/00 (2013.01); G06F 11/3013 (2013.01); G06F 11/3058 (2013.01); H04M 1/72522 (2013.01); G01K 2217/00 (2013.01); H04M 2250/12 (2013.01);
Abstract

A method of detecting an environment vale of an electronic device is provided. The method includes measuring a state of one or more units related to the electronic device, determining a value based at least in part on the measured state of the one or more units related to the electronic device, determining an operation state of the electronic device according to the value, and generating an approximated environment value according to the operation state. Further, other various embodiments are available.


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