The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Nov. 08, 2016
Applicant:

Sii Semiconductor Corporation, Chiba-shi, Chiba, JP;

Inventor:

Takao Nakashimo, Chiba, JP;

Assignee:

ABLIC INC., Chiba, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 7/16 (2006.01);
U.S. Cl.
CPC ...
G01K 7/16 (2013.01);
Abstract

Provided is an overheat detection circuit capable of easily adjusting a detection temperature of the overheat detection circuit. The overheat detection circuit includes: a first resistor; a second resistor, which has the same temperature characteristics with the first resistor, and has an adjustable resistance value; and a heat sensitive element connected to one end of the second resistor, in which a first current, which is based on a first voltage, is supplied to the first resistor, a current, which is proportional to the first current, is supplied to the second resistor so that a second voltage is generated at another end of the second resistor, and when the first voltage and the second voltage are compared, a result of the comparison is output as an overheat detection signal.


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