The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Sep. 05, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Haruhiko Horiguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/20 (2006.01); G01B 21/04 (2006.01); G01D 5/12 (2006.01); G01D 5/244 (2006.01); G01D 5/34 (2006.01); G01D 5/36 (2006.01); G06F 17/17 (2006.01);
U.S. Cl.
CPC ...
G01B 21/20 (2013.01); G01B 21/045 (2013.01); G01D 5/12 (2013.01); G01D 5/24471 (2013.01); G01D 5/34 (2013.01); G01D 5/36 (2013.01); G06F 17/17 (2013.01);
Abstract

The present invention provides: a rotary encoder checking an eccentricity state of a scale by sensor units; and related matters. The scale moves, relatively to the sensor units, around a rotational axis line. The pair of sensor units are arranged opposite to each other sandwiching the rotational axis line Ctherebetween. A processing system acquires output signals from each of the sensor units, at a plurality of rotation angles at which the scale has moved relatively to the sensor units. The processing system determines first phase information based on the output signal obtained from the sensor unit, and second phase information based on the output signal obtained from the sensor unit. The processing system determines eccentricity information based on a differential value between any one of the first phase information and the second phase information and an average value of the first phase information and the second phase information.


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