The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

May. 16, 2017
Applicant:

Ckd Corporation, Aichi, JP;

Inventors:

Tsuyoshi Ohyama, Aichi, JP;

Norihiko Sakaida, Aichi, JP;

Takahiro Mamiya, Aichi, JP;

Hiroyuki Ishigaki, Aichi, JP;

Assignee:

CKD Corporation, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 11/06 (2006.01); H04N 5/225 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 11/0608 (2013.01); G01B 11/25 (2013.01); H04N 5/2256 (2013.01); H04N 7/183 (2013.01);
Abstract

A measurement apparatus includes an illumination device irradiating an object with a first and a second pattern, a camera taking image data of the object, a motor displacing the object, and a processor measuring the object, obtaining a first value of the object based on a first number of image data taken with the first pattern at a first number of phases at a first position, obtaining a gain and/or offset based on the first number of image data, obtaining a second value of the object based on the gain and/or offset and a second number of image data taken with the second pattern at a second number of phases at a second position, obtaining height data of the object based on the first and the second value, and obtaining the second value with an average of the gain and/or offset of pixels adjacent to each pixel.


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