The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Jul. 21, 2017
Applicant:
Kyooka Co., Ltd., Tokyo, JP;
Inventors:
Yoshiteru Kyooka, Tokyo, JP;
Masato Abe, Yamagata, JP;
Assignee:
KYOOKA CO., LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/14 (2006.01); H05K 1/02 (2006.01); H05K 1/16 (2006.01); G01B 7/02 (2006.01); B64F 5/10 (2017.01);
U.S. Cl.
CPC ...
G01B 7/14 (2013.01); G01B 7/023 (2013.01); H05K 1/028 (2013.01); H05K 1/162 (2013.01); B64F 5/10 (2017.01); H05K 2201/10151 (2013.01);
Abstract
A probe is a three-layer substrate having two faces on which paired electrodes are formed at corresponding positions and guard patterns are formed around the electrodes. The guard patterns and all electrodes are driven by a common probe signal to an equal potential, thereby commonly guarding the electrodes. Based on a clamp current of each electrode, a capacitance is found to obtain gap data.