The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Jul. 20, 2017
Applicant:

Jeffrey Gustav Gjertsen, Austin, TX (US);

Inventor:

Jeffrey Gustav Gjertsen, Austin, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/08 (2006.01); G01B 5/14 (2006.01); G01B 3/56 (2006.01); G01B 5/00 (2006.01); G01B 3/00 (2006.01); G01B 5/02 (2006.01); G01B 5/24 (2006.01);
U.S. Cl.
CPC ...
G01B 3/08 (2013.01); G01B 3/004 (2013.01); G01B 3/563 (2013.01); G01B 5/0007 (2013.01); G01B 5/02 (2013.01); G01B 5/14 (2013.01); G01B 5/24 (2013.01);
Abstract

The invention is a tool for measuring the distance and angle between two points on two surfaces to measure position of the points and surfaces relative to one another to provide the user with angle and distance measurements which fully define the relationship between the surfaces and points without additional calculations.


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Gjertsen, Jeffrey. (2019). Tool for measuring angles and length in structures and frames (U.S. Patent No. 10514243). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10514243

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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