The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Jul. 11, 2016
Applicant:
New York University, New York City, NY (US);
Inventors:
Justin Lee, New York City, NY (US);
Bhubaneswar Mishra, Great Neck, NY (US);
Evgeny Nudler, New York City, NY (US);
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6869 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6869 (2013.01); C12Q 1/6869 (2013.01); C12Q 2521/313 (2013.01); C12Q 2525/191 (2013.01); C12Q 2531/101 (2013.01); C12Q 2565/514 (2013.01);
Abstract
A method for detecting rare genomic variants in a population of cells is disclosed. The method can detect de novo mutations in bacteria and analyze the impact of various physiological conditions on mutation rate, even though such effects would be too subtle to detect using other methods. The method can be used for detection of low-frequency subpopulations in the microbiome or in cancer.