The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Jan. 24, 2019
Qcify Inc, San Mateo, CA (US);
Qcify Inc., San Mateo, CA (US);
Abstract
An adaptable inspection unit includes an attachment mechanism, an inspection sensor device, a data port that is capable of transmitting information, and a power port that is connectable to a power source, all of which are physically connected together. The adaptable inspection unit also includes a memory circuit and a processor circuit. The processing circuit controls the inspection sensor device and writes information transmitted via the data port. The attachment mechanism is a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, an adhesive, a magnet, a latch, a lock, a locating pin, a rail, a slide, locking pin, a bolt, a screw, gravity or friction. The attachment mechanism is used to connect the adaptable inspection unit to a processing line such that the adaptable inspection unit is capable of capturing an image of a sample traveling along the processing line.