The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Jan. 11, 2018
Hitachi, Ltd., Tokyo, JP;
Ravigopal Vennelakanti, San Jose, CA (US);
Christophe Loth, Santa Clara, CA (US);
Iwao Tanuma, Tokyo, JP;
Anshuman Sahu, Los Gatos, CA (US);
Hitachi, Ltd., Tokyo, JP;
Abstract
In some examples, a system may receive log data including a depth-series of data for a sensed parameter. The system may determine a parameter value of the depth series data for individual subunits of depth corresponding to a larger unit of depth. The system may further determine a scale of graphic effects corresponding to parameter values for the depth-series data. The system may present, on a display, a visualization of the depth-series data. For instance, the visualization may include a plurality of cells arranged in a plurality of rows, with each cell corresponding to the larger unit of depth and including a plurality of subcells corresponding to the subunits of depth. Additionally, each subcell may be presented with a respective graphic effect corresponding to the parameter value determined at a corresponding depth, and the graphic effect may correspond to the parameter value on the scale of graphic effects.