The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Jun. 21, 2013
Malvern Panalytical Limited, Worcestershire, GB;
E. Neil Lewis, Olney, MD (US);
John McCaffrey, Columbia, MD (US);
Ken Haber, Frederick, MD (US);
Peter Bennett, Columbia, MD (US);
Gerald Sando, Columbia, MD (US);
Tomasz Sadowski, Warsaw, PL;
Malvern Panalytical Limited, Malvern, Worcestershire, GB;
Abstract
The disclosure relates to methods and device for detecting properties of heterogeneous samples, including detecting properties of particles or fluid droplets in industrial processes. A probe may be inserted into a first of multiple heterogeneous fluid samples. A portion of the first sample may be drawn into the probe and past a two-dimensional array detector. The portion of the first sample may be illuminated as it is drawn past the array detector and an image of the portion of the first sample may be acquired. The probe may be inserted into a second of multiple heterogeneous fluid samples. A portion of the second sample may be drawn into the probe and past a two-dimensional array detector. The portion of the second sample may be illuminated as it is drawn past the array detector and an image of the portion of the second sample may be acquired.