The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Mar. 28, 2016
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Alex Masuo Kaneko, Tokyo, JP;

Kenjiro Yamamoto, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G05D 1/02 (2006.01); G06T 7/11 (2017.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00798 (2013.01); G05D 1/0246 (2013.01); G06K 9/00818 (2013.01); G06T 1/0007 (2013.01); G06T 7/11 (2017.01); G06T 2207/30256 (2013.01);
Abstract

Landmark recognition can handle various landmarks with a low processing load and high reliability. Provided are a database, a segmentation processor, a pattern extraction processor, and a database comparison processor. The database stores landmark extraction information associated with landmark determination condition information, the landmark extraction information identifying a region including a landmark of an image, and allowing right-opposite positioning of the landmark, the landmark determination condition information used for determining landmark pattern information as the landmark. The segmentation processor sets a plurality of segmentation lines with respect to the region including the landmark of the image in a direction parallel to the landmark from a direction right opposite to the landmark, and determines a distance between intersections of the segmentation lines and a boundary of the landmark. The pattern extraction processor obtains the landmark pattern information that represents a characteristic of the pattern of the landmark as numerical value information in response to the distance between the intersections determined for each of the plurality of segmentation lines. The database comparison processor compares the landmark pattern information extracted in the pattern extraction processor with the landmark determination condition information registered in the database to identify the kind of the landmark.


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