The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
May. 14, 2019
Sas Institute Inc., Cary, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing device determines hyperparameter values for outlier detection. An LOF score is computed for observation vectors using a neighborhood size value. Outlier observation vectors are selected from the observation vectors. Outlier mean and outlier variance values are computed of the LOF scores of the outlier observation vectors. Inlier observation vectors are selected from the observation vectors that have highest computed LOF scores of the observation vectors that are not included in the outlier observation vectors. Inlier mean and inlier variance values are computed of the LOF scores of the inlier observation vectors. A difference value is computed using the outlier mean and variance values and the inlier mean and variance values. The process is repeated with each neighborhood size value of a plurality of neighborhood size values. A tuned neighborhood size value is selected as the neighborhood size value associated with an extremum value of the difference value.