The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Jun. 23, 2017
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Lenin Ravindranath Sivalingam, Redmond, WA (US);
Sergey Kanzhelev, Redmond, WA (US);
Suman Kumar Nath, Redmond, WA (US);
Madan Musuvathi, Redmond, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
System and methods are provided for optimal error detection in programmatic environments through the utilization of at least one user-defined condition. Illustratively, the conditions can include one or more triggers initiating the collection of log data for methods associated with the provided at least one condition. Operatively, the disclosed systems and methods observe the run-time of the programmatic environment and initiate the collection of log data based on the occurrence of a condition trigger. A rank score can also be calculated to rank the methods associated with the defined condition to isolate those methods that have higher probability of causing the defined condition. Dynamic instrumentation of the methods associated with the user defined conditions during run time are used to calculate the rank score, which is used for ranking the methods.