The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Nov. 25, 2015
Endress + Hauser Conducta Gesellschaft Für Mess-und Regeltechnik Mbh + Co. KG, Gerlingen, DE;
Thomas Alber, Stuttgart, DE;
Joachim Albert, Leonberg, DE;
Endress+Hauser Conducta GmbH+Co. KG, Gerlingen, DE;
Abstract
A method for controlling a process, comprising treatment of a process medium, and which includes a system input, in particular, an inlet, and a system output, in particular, an outlet for the process includes such a dead time profile that a change in at least one parameter of the first type of the process medium at the system input causes a change in at least one parameter of the second type of the process medium at the system output only after an elapse of a dead time, comprises: determining, in particular, digital values for the parameter of the first type and using these values as input values of a control system; determining the set values for an output variable influencing the parameter of the second type of the process medium at the system output, using the determined values of the parameter of a first type and a first proportionality factor recorded in the control system; applying the determined set values for adjusting the output variable using the control system; determining, in particular, digital values for the parameters of the second type; determining the deviation values, which are representative of a deviation of the parameter of the second type from the parameter of the first type, from the determined values of the parameter of the first type and the determined values of the parameter of the second type; and use of at least one of the deviation values and at least one of the set values to determine a second proportionality factor.