The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Mar. 15, 2017
Applicant:

Elenion Technologies, Llc, New York, NY (US);

Inventors:

Kishore Padmaraju, New York, NY (US);

Thomas Wetteland Baehr-Jones, Arcadia, CA (US);

Bernd-Harald Horst Jurgen Rohde, Munich, DE;

Robert Palmer, Munich, DE;

Matthew Akio Streshinsky, New York, NY (US);

Marc Bohn, Gauting, DE;

Torsten Wuth, Munich, DE;

Assignee:

Elenion Technologies, LLC, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/225 (2006.01); G02F 1/01 (2006.01); G02F 1/21 (2006.01); H04B 10/516 (2013.01);
U.S. Cl.
CPC ...
G02F 1/225 (2013.01); G02F 1/0123 (2013.01); G02F 2001/212 (2013.01); H04B 10/516 (2013.01);
Abstract

An optical waveguide modulator with automatic bias control is disclosed. A dither signal is applied to the modulator bias and its signature detected in light tapped from an output of the modulator using a phase sensitive dither detector such as a lock-in amplifier. The detected signal is processed using pre-recorded information defining the direction of the detected signal change relative to a change in the modulator bias, and the bias is adjusted in the direction determined using the information. An IQ bias of a quadrature modulator is controlled by dithering bias settings of two inner modulators at different dither frequencies, and detecting an oscillation at a sum frequency.


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