The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Mar. 20, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Hiroaki Furukawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/34 (2006.01); H01J 49/04 (2006.01); C12M 1/16 (2006.01); C12M 1/20 (2006.01); G01N 23/2204 (2018.01); G01N 23/223 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2204 (2013.01); B01L 3/5055 (2013.01); G01N 23/223 (2013.01);
Abstract

When conducting an analysis of a sample using an X-ray fluorescence spectrometer, a user allows a sample holder to hold the sample such that the sample is sandwiched between a first film and a second film, and mounts the sample holder in this state to the spectrometer. When conducting an analysis of the sample using a Fourier transform infrared spectrometer, the user allows the sample holder to hold the sample such that the sample is not sandwiched between the first film and the second film, and mounts the sample holder in this state to the spectrometer.


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Furukawa, Hiroaki. (2019). Sample holder (U.S. Patent No. 10508999). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10508999

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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