The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Oct. 17, 2017
Heraeus Quarzglas Gmbh & Co. KG, Hanau, DE;
Maximilian Schmitt, Dieburg, DE;
Bodo Kühn, Gelnhausen, DE;
Heraeus Quarzglas GmbH & Co. KG, Hanau, DE;
Abstract
A method for determining the refractive index profile of a preform is provided. The method involves: preparing the measured deflection angle distribution, including an extreme value determination of the deflection angle distribution, to obtain a prepared deflection angle distribution; transforming the prepared deflection angle distribution into a prepared refractive-index profile; evaluating the prepared refractive-index profile for the fixation of orientation values for the layer radius and for the layer refractive index of a hypothetical refractive index profile; generating a simulated deflection angle distribution on the basis of the hypothetical refractive-index profile with the orientation values, and transforming the deflection angle distribution into a simulated refractive-index profile; fitting the simulated refractive index profile to the prepared refractive-index profile by iterative adaptation of parameters to obtain a fitted, simulated refractive-index profile which is defined by adapted parameters, and obtaining the refractive index profile as the hypothetical refractive-index profile with the adapted parameters.