The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Nov. 29, 2016
Primes Gmbh Meßtechnik Für Die Produktion Mit Laserstrahlung, Pfungstadt, DE;
Reinhard Kramer, Pfungstadt, DE;
Otto Märten, Dreieich, DE;
Stefan Wolf, Groß-Gerau, DE;
Roman Niedrig, Berlin, DE;
Primes GmbH Mebtechnik fur die Produktion mit Laserstrahlung, Pfungstadt, DE;
Abstract
The invention relates to a measuring probe for scanning light beams () or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam () with high spatial resolution. For this purpose, a device is proposed which comprises a body (), a probe area () and a detector (). The body () is made of an optically transparent material and has a light beam entry surface (), a light beam exit surface () and a detection light exit surface (). The light beam entry surface () and the light beam exit surface () are for the most part smooth and polished. The body () includes the probe area () having light-deflecting structuring. The detector () is designed to detect at least part of the beam portion () deflected from the light beam () by the probe area (). The body () and the light beam () are movable in two different directions of movement () perpendicular to the direction of the axis () of the light beam () relative to each other. The probe area () has a shape whose two-dimensional projection on a surface perpendicular to the axis () of the light beam () approximately the same dimensions in the two different directions of movement () perpendicular to the axis () of the light beam ().