The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Feb. 13, 2018
Omron Corporation, Kyoto, JP;
Ryota Hasegawa, Ayabe, JP;
Hiroyuki Tsuchida, Ayabe, JP;
Kazuaki Miyamoto, Fukuchiyama, JP;
Yusuke Hayashi, Kameoka, JP;
Kenji Matsuoka, Moriyama, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A method of manufacturing a proximity sensor and a manufacturing system for the proximity sensor capable of improving detection precision or expanding a detectable range are provided. A method of manufacturing a proximity sensor outputting presence or absence of a detection object or a position of the detection object as a detection result is provided. The manufacturing method includes: disposing the proximity sensor in a temperature-changeable environment; setting an environment of the proximity sensor to a plurality of different temperatures respectively and storing temperature detected by the temperature detection part of the proximity sensor in association with the detection result output by the control calculation part at each temperature; determining a characteristic parameter unique to a target proximity sensor based on the stored temperature and detection result; and setting the determined characteristic parameter for the target proximity sensor.