The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Jun. 12, 2017
Keyence Corporation, Osaka, JP;
Jun Tabuchi, Osaka, JP;
Takashi Nakatsukasa, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
A three-dimensional measurement device which is capable of increasing the operability at the time of repeatedly performing dimension measurement for a plurality of measurement target objects having substantially the same shape is provided. There are included a template storage unit for storing, as a template, model three-dimensional shape data and an operation procedure of dimension measurement performed on the model three-dimensional shape image, and a positional relationship specification unit for specifying a relative positional relationship between the model three-dimensional shape data and measurement three-dimensional shape data. The geometric element extraction unit specifies a geometric element of a measurement three-dimensional shape based on the relative positional relationship and the template, and the dimension value calculation unit performs dimension measurement on the measurement three-dimensional shape based on the relative positional relationship and the template.