The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Sep. 22, 2016
General Electric Company, Schenectady, NY (US);
Yannan Jin, Niskayuna, NY (US);
Geng Fu, Rexford, NY (US);
Peter M. Edic, Albany, NY (US);
Hewei Gao, Pleasanton, CA (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
There is set forth herein a method including performing with an X-ray detector array of a CT imaging system one or more calibration scans, wherein the one or more calibration scans include obtaining for each element of the first through Nth elements of the X-ray detector array one or more calibration measurements; and updating a spectral response model for each element of the first through Nth elements using the one or more calibration measurements. In another aspect, a CT imaging system can perform imaging, e.g. including material decomposition (MD) imaging, using updated spectral response models for elements of an X-ray detector array. The spectral response models can be updated using a calibration process so that different elements of an X-ray detector array have different spectral response models.