The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Dec. 15, 2015
Amo Wavefront Sciences, Llc, Albuquerque, NM (US);
Daniel Neal, Tijeras, NM (US);
Thomas D. Raymond, Edgewood, NM (US);
Richard J. Copland, Albuquerque, NM (US);
Wei Xiong, Albuquerque, NM (US);
Paul D. Pulaski, Albuquerque, NM (US);
Stephen Farrer, Albuquerque, NM (US);
Carmen Canovas Vidal, Groningen, NL;
Daniel Hamrick, Cedar Crest, NM (US);
AMO WaveFront Sciences, LLC, Albuquerque, MN (US);
Abstract
An optical measurement system and apparatus for carrying out cataract diagnostics in an eye of a patient includes a Corneal Topography Subsystem, a wavefront aberrometer subsystem, and an eye structure imaging subsystem, wherein the subsystems have a shared optical axis, and each subsystem is operatively coupled to the others via a controller. The eye structure imaging subsystem is preferably a fourierdomain optical coherence tomographer, and more preferably, a swept source OCT.