The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Jul. 11, 2016
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Dae-Young Lee, Seongnam-si, KR;
Chul-Woo Byeon, Suwon-si, KR;
Ju-Ho Son, Seoul, KR;
Jeong-Ho Lee, Suwon-si, KR;
Mee-Ran Kim, Ansan-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An apparatus and a method for phase calibration in a radio frequency (RF) module that constitutes a wireless communication device are provided. The apparatus and method include a test signal is emitted by a forward transmission antenna array of a first antenna array, and the emitted test signal, which is transferred by a member that covers the first and second antenna arrays, is received through a forward reception antenna array of the second antenna array. On the basis of the received test signal, a phase value is calibrated with regard to each of chain combinations formed by the first and second antenna arrays. Forward chain combinations that constitute the chain combination may be determined by a combination of forward transmission chains, which correspond to respective transmission antennas that constitute the forward transmission antenna array, and forward reception chains, which correspond to respective reception antennas that constitute the forward reception antenna array.