The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Jul. 24, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Taryn J. Davis, Beacon, NY (US);

Jonathan R. Fry, Wappingers Falls, NY (US);

Terence L. Kane, Wappingers Falls, NY (US);

Christopher F. Klabes, Poughkeepsie, NY (US);

Andrew J. Martin, Carmel, NY (US);

Vincent J. McGahay, Poughkeepsie, NY (US);

Kathryn E. Schlichting, Bloomington, MN (US);

Melissa A. Smith, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01K 3/10 (2006.01); H01L 21/66 (2006.01); G01K 3/04 (2006.01);
U.S. Cl.
CPC ...
H01L 22/34 (2013.01); G01K 3/04 (2013.01); H01L 22/14 (2013.01); H01L 22/26 (2013.01); G01K 3/10 (2013.01);
Abstract

A time temperature monitoring system and method for use with a microchip or similar structure. A disclosed system includes: an active region; a dopant source located proximate the active region; an activation system for activating a diffusion of the dopant source into the active region; and a set of electrodes embedded in the active region of the substrate, wherein the electrodes are configured to detect the diffusion in the active region at varying distances from the dopant source to provide time temperature information.


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