The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Sep. 19, 2018
Applicant:

Bruker Daltonik Gmbh, Bremen, DE;

Inventors:

Tobias Boskamp, Worpswede, DE;

Delf Lachmund, Bremen, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/16 (2006.01); H01J 49/00 (2006.01); H01J 49/40 (2006.01); G01N 33/68 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
H01J 49/164 (2013.01); G01N 33/6851 (2013.01); G06K 9/6298 (2013.01); H01J 49/004 (2013.01); H01J 49/0036 (2013.01); H01J 49/40 (2013.01);
Abstract

A number of standard methods exist for normalizing MALDI-TOF data, but they are not able to compensate adequately for the observed technical variability. The invention creates an improved normalization method for MALDI-TOF mass spectrometry data. This is achieved by an intensity profile normalization, where, by way of example, 1) Firstly, an intensity profile is formed for each individual spectrum, and this intensity profile describes the statistical distribution of the intensity values within different mass ranges; 2) Then an average reference profile is formed for an ensemble of spectra; 3) Finally, the individual spectra are transformed in such a way that their intensity profiles correspond to the reference profile.


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