The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Jun. 28, 2016
Applicant:

Honda Motor Co., Ltd., Minato-Ku, Tokyo, JP;

Inventors:

Takanori Maebashi, Wako, JP;

Nariaki Kuriyama, Wako, JP;

Yoshiya Fujiwara, Wako, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); H01M 10/42 (2006.01); G01N 23/2204 (2018.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); G01N 23/2204 (2013.01); H01M 10/4285 (2013.01); H01J 2237/2003 (2013.01); H01J 2237/2802 (2013.01);
Abstract

An analytical cell includes a first substrate and a second substrate each having a through hole extending in a thickness direction thereof. The first substrate and the second substrate are partially overlapped with each other to form an overlapping portion. In the overlapping portion, a solid state joint is formed by solid state bonding of a first solid portion protruding from the first substrate and a second solid portion protruding from the second substrate, whereby the first substrate and the second substrate are spaced from each other by a predetermined distance, and joined together in a state where the first substrate and the second substrate are positioned to form an observation window. At the observation window, the through holes of the first substrate and the second substrate face each other, and an electron beam is transmitted through the observation window.


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