The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Dec. 08, 2017
Applicant:

Lg Display Co., Ltd., Seoul, KR;

Inventors:

Hyuckjun Kim, Goyang-si, KR;

Bumsik Kim, Suwon-si, KR;

Jaeyoon Bae, Seoul, KR;

Seungtae Kim, Goyang-si, KR;

Kyoungdon Woo, Paju-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/3233 (2016.01); G09G 3/20 (2006.01); H01L 27/32 (2006.01); H01L 51/52 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3233 (2013.01); H01L 27/3276 (2013.01); H01L 51/5203 (2013.01); G09G 3/2081 (2013.01); G09G 2310/0205 (2013.01); G09G 2310/0264 (2013.01); G09G 2310/04 (2013.01); G09G 2320/103 (2013.01); G09G 2360/16 (2013.01);
Abstract

A display device includes a display panel on which a plurality of pixels connected to data lines, reference lines, and gate lines are arranged, each pixel having an organic light emitting diode (OLED) and a driving thin film transistor (TFT); a data drive circuit to supply a data voltage to the data lines and a reference voltage to the reference lines; a gate drive circuit to generate a scan signal and a sensing signal and to supply the scan signal and the sensing signal to the gate lines, the scan signal being synchronized with the data voltage and the sensing signal being synchronized with the reference voltage; and a timing controller to divide one frame into a programming time, an emission time, and a non-emission time, and to control an emission duty by variably controlling the programming time based on an analysis of input image data.


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