The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Jan. 22, 2018
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Eiichi Kobayashi, Tama, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/60 (2006.01); G02B 23/24 (2006.01); F01D 21/00 (2006.01); F01D 17/06 (2006.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); F01D 17/06 (2013.01); F01D 21/003 (2013.01); G02B 23/24 (2013.01); G02B 23/2484 (2013.01); F05D 2270/802 (2013.01); F05D 2270/8041 (2013.01);
Abstract

An endoscope system includes a borescope configured to pick up images of a rotatable inspection target with a linear sensor at predetermined time intervals to acquire a plurality of first inspection target images, a borescope configured to pick up images of the inspection target with a linear sensor at the predetermined time intervals in synchronization with the acquisition timing of the first inspection target images to acquire a plurality of second inspection target images, and a PC. The PC reconstructs image data on each of the plurality of first inspection target images based on time-series image information formed of the second inspection target images arranged over time and a correction table containing a position of a pixel including a predetermined feature quantity in each of the second inspection target images and an amount of an angle of rotation of the inspection target.


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