The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Oct. 27, 2016
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Maxym Gerashchenko, Heidelberg, DE;

Gordon Muckle, Altrip, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06314 (2013.01); G06Q 10/0639 (2013.01);
Abstract

An audit schedule is determined from a database storing a master data set comprising audit events, system parameters, and resources. Audit events are grouped according to information of the master data set, for example shared units (e.g., product, service, organization, risk level, audit type, etc.). Audit groups are prioritized by factors such as unit priority and audit duration. A random audit event within the group is chosen, and then a time slot is selected according to a desired distribution (e.g., left-to-right), determining resource availability for that slot. The procedure may optionally consider additional constraints (e.g., manually added, national holidays, auditor availability) outside the master data set. The procedure shuffles through audit events of the group with the highest priority, and then through audit events of lower priority groups, filling out the audit schedule according to resource availability and constraints. Audit schedule changes are recorded in a change log data object.


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