The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Jun. 23, 2015
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Hanan Shteingart, Herzliya, IL;

Yair Tor, Redmond, WA (US);

Eli Koreh, Tel Aviv, IL;

Amit Hilbuch, Kfar Saba, IL;

Yifat Schacter, Tel Aviv, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

Disclosed herein is a system and method that can be used with any underlying classification technique. The method takes into account both the value of the current feature vector. It is based on evaluating the effect of perturbing each feature by bootstrapping it with the negative samples and measuring the change in the classifier output. To assess the importance of a given feature value in the classified feature vector, a random negatively labeled instance is taken out of the training set and replaces the feature at question with a corresponding feature from this set. Then, by classifying the modified feature vector and comparing its predicted label and classifier output a user is able measure and observe the effect of changing each feature.


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