The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Dec. 01, 2015
Linkedin Corporation, Mountain View, CA (US);
Ritesh Maheshwari, Mountain View, CA (US);
Liang Zhang, Fremont, CA (US);
Yang Yang, Fremont, CA (US);
Jieying Chen, Sunnyvale, CA (US);
Ruixuan Hou, Sunnyvale, CA (US);
Steven S. Noble, Soquel, CA (US);
David Q. He, Cupertino, CA (US);
Sanjay S. Dubey, Fremont, CA (US);
Deepak Agarwal, Sunnyvale, CA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
A system for processing data is provided. During operation, the system obtains a current window of one or more intervals of timeseries data collected from a monitored system. Next, the system continuously performs a statistical hypothesis test that compares the one or more intervals of the time-series data with baseline values from historic time-series data associated with the monitored system. When the statistical hypothesis test indicates a deviation of the time-series data from the baseline values, the system outputs an alert of an anomaly represented by the deviation.