The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Aug. 13, 2015
C 3 Limited, Tauranga, NZ;
Nawar Sami Alwesh, Flat Bush, NZ;
Glen Edward Murphy, Lynmore, NZ;
David William Penman, Avondale, NZ;
Johann August Schoonees, Kohimarama, NZ;
Robert Jan Valkenburg, Mount Albert, NZ;
C 3 Limited, Tauranga, NZ;
Abstract
A log scanning system and method for scanning a log load. Each individual log in the log load may have an ID element with a unique log ID data on at least one log end face. The system has a handheld scanner unit for free-form scanning by an operator over a load end face of the log load. The scanner unit has a depth sensor configured to capture a series of depth images of the load end face and a texture sensor configured to capture a series of texture images of the load end face during the load end face scan. The system also has a data processor(s) that receives and processes the depth and texture images captured from the scan. The processor(s) are configured to fuse the depth images or depth and texture images into a data model of the load end face, determine log end boundaries of the individual logs visible in the load end face by processing the data model, process the texture images to identify and decode any ID elements visible in the scan to extract individual log ID data, and generate output data representing the log load based on the determined log end boundaries and extracted log ID data.