The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Apr. 26, 2017
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Edgar Barber, Ness Ziona, IL;

Alex Bazarsky, Holon, IL;

Ariel Navon, Revava, IL;

Gadi Vishne, Petach-Tikva, IL;

Joshua Lehmann, Modin, IL;

Judah Gamliel Hahn, Ofra, IL;

Assignee:

SANDISK TECHNOLOGIES LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 3/06 (2006.01); G11C 11/56 (2006.01); G11C 16/34 (2006.01); G11C 29/02 (2006.01); G11C 29/44 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1016 (2013.01); G06F 3/0604 (2013.01); G06F 3/0647 (2013.01); G06F 3/0659 (2013.01); G06F 3/0688 (2013.01); G11C 11/5642 (2013.01); G11C 16/349 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01); G11C 29/44 (2013.01); G11C 29/52 (2013.01);
Abstract

Apparatuses, systems, and methods are disclosed for dynamic read operations. An on-die controller monitors one or more read statistics during a read operation for data of a non-volatile memory die. An on-die controller determines whether one or more read statistics satisfy a threshold for a read operation. An on-die controller dynamically modifies a read operation based on determining that one or more read statistics fail to satisfy a threshold.


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