The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Apr. 14, 2017
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Cathleen F. Kilpatrick, Bethlehem, PA (US);

Antoine Guillot, Doylestown, PA (US);

Meenal Gharpure, Bangalore, IN;

Michael James Waynick, Hatboro, PA (US);

Yong Yang, Shanghai, CN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0272 (2013.01); G05B 19/0428 (2013.01); G05B 23/0256 (2013.01); G05B 23/0264 (2013.01);
Abstract

A method includes receiving information defining multiple functional configurations associated with an industrial process control and automation system. The functional configurations identify operations to be performed by the control and automation system. The method also includes receiving, at a test system integrated in the control and automation system, information defining multiple tests to be performed on the control and automation system. The method further includes executing the tests using the test system, where the test system accesses data from both the test system and the control and automation system.


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