The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Jan. 15, 2018
Omron Corporation, Kyoto, JP;
Atsushi Kitamura, Kusatsu, JP;
Takahiro Toku, Kusatsu, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A control system that can adjust a period required for detecting an abnormality occurring in a control object is provided. The control system includes: feature quantity creating means that creates a feature quantity from data which is acquired from the control object based on a first parameter associated with elements defining the feature quantity; deviation acquiring means that acquires a degree of deviation between the feature quantity created by the feature quantity creating means and a group of feature quantities stored by a storage means based on a second parameter associated with a range in the group of feature quantities; abnormality detecting means that detects an abnormality occurring in the control object based on the degree of deviation acquired by the deviation acquiring means and a threshold value; and instruction means that instructs the deviation acquiring means to start execution based on an execution cycle of the deviation acquiring means.