The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Mar. 26, 2013
Applicant:
Westerngeco L.l.c., Houston, TX (US);
Inventors:
Ivan Pires De Vasconcelos, Coton, GB;
James E. Rickett, Cambridge, GB;
Assignee:
WESTERNGECO L.L.C., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/32 (2006.01); G01V 1/34 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/325 (2013.01); G01V 1/307 (2013.01); G01V 1/345 (2013.01);
Abstract
Processing measurements to create 'reflectivity' data at a datum for a target using Joint Point-Spread Functions. The 'reflectivity' data can be an image or an extended image. The methods can create single reflectivity data from measurements from multiple experiments, or multiple processed datasets via different processing routes from measurements from a single experiment, or measurements from a single experiment with multiple simultaneous sources.