The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Aug. 18, 2017
Samsung Electronics Co., Ltd., Suwon-si, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Hyun Wook Park, Daejeon, KR;
Jae Jin Cho, Daejeon, KR;
Dongchan Kim, Incheon, KR;
Hyunseok Seo, Daejeon, KR;
Kinam Kwon, Daejeon, KR;
Seohee So, Daejeon, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Abstract
A method of controlling a magnetic resonance imaging (MRI) apparatus including performing, by the MRI apparatus, blipped-controlled aliasing parallel imaging (blipped-CAIPI) obtaining k-space data on a subject determining a phase error of a chemical shift component, wherein the phase error of the chemical shift component is proportional to a geometric error based on a resonant frequency difference between a main component and the chemical shift component in the subject comparing the k-space data with data in which the phase error of the chemical shift component is reflected, wherein the data in which the phase error of the chemical shift component is reflected is associated with data on the main component and data on the chemical shift component and determining final data for image restoration based on a result of the comparison.