The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Feb. 26, 2019
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Hyun-Kyung Shin, Daejeon, KR;

Dong-Wook Sung, Daejeon, KR;

Sang-Joon Lee, Daejeon, KR;

Assignee:

LG CHEM, LTD., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/389 (2019.01); H01M 10/42 (2006.01); H01M 2/14 (2006.01); G01R 31/378 (2019.01); H01M 2/16 (2006.01); H01M 10/48 (2006.01);
U.S. Cl.
CPC ...
G01R 31/389 (2019.01); G01R 31/378 (2019.01); H01M 2/145 (2013.01); H01M 2/16 (2013.01); H01M 10/4285 (2013.01); H01M 10/488 (2013.01);
Abstract

A method for evaluating the insulating performance of a separator using an insulating performance evaluation system according to an exemplary embodiment of the present disclosure includes: preparing a measurement subject wherein a metal contact layer is interposed between two sheets of separator so as to form a plurality of local contacts with the surface of the separator; sandwiching the measurement subject between an upper jig and a lower jig; applying a voltage the magnitude of which varies with time between the upper jig and the lower jig using a voltage application unit; receiving a current measurement value flowing between the upper jig and the lower jig as an input from a current measurement unit; and determining the voltage value at which the current measurement value is equal to or greater than a preset critical value as a dielectric breakdown voltage, by a control unit.


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