The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Jan. 15, 2018
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
York Oberdoerfer, Lagenfeld, DE;
Weiwei Zhang, Huerth, DE;
Assignee:
General Electric Company, Schenectedy, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01N 29/22 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01); G01N 29/069 (2013.01); G01N 29/0645 (2013.01); G01N 29/226 (2013.01); G01S 7/52061 (2013.01); G01S 7/52063 (2013.01); G01S 15/894 (2013.01); G01S 15/8925 (2013.01); G01N 2291/106 (2013.01);
Abstract
A testing system for testing a work piece. The testing system may be non-destructive. An associated method. The method may include obtaining C-scan images and corresponding S-scan images. The C-scan images and the corresponding S-scan images are of the same portion of the work piece being tested.