The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Oct. 25, 2017
Quest Integrated, Llc, Kent, WA (US);
Haraprasad Kannajosyula, Seattle, WA (US);
Phillip D. Bondurant, Covington, WA (US);
Ali Minachi, Kent, WA (US);
Quest Integrated, LLC, Kent, WA (US);
Abstract
Systems and methods for specimen inspection using ultrasonic wave generation are disclosed herein. In one embodiment, an apparatus for inspecting a solid object using ultrasound includes: a pulser having pulser ports for outputting electrical signals. The apparatus also includes a switching array for receiving the signals from the pulser ports as individual channels, and routing the signals to individual elements of a transmitter array. The apparatus also includes the transmitter array, where each element of the transmitter array generates ultrasound in the solid object in response to the signal received from the switching array.