The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Mar. 30, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Vladimir Anatolievich Lobastov, Waterford, NY (US);

Adrian Ivan, Niskayuna, NY (US);

David Charles Bogdan, Jr., Charlton, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 30/00 (2015.01); B23K 15/02 (2006.01); G01N 23/2252 (2018.01); B33Y 50/02 (2015.01); B23K 15/00 (2006.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
G01N 23/2252 (2013.01); B23K 15/0086 (2013.01); B23K 15/02 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01N 2223/646 (2013.01); G01N 2223/648 (2013.01);
Abstract

An additive manufacturing system includes a cabinet, an electron beam system, at least one imaging device, and a computing device. The cabinet is configured to enclose a component and defines a pinhole extending therethrough. The electron beam system is configured to generate an electron beam directed toward the component. Interactions between the component and the electron beam generate x-ray radiation. The at least one imaging device is configured to detect the x-ray radiation through the pinhole. The computing device is configured to image the component based on the x-ray radiation detected by the at least one imaging device.


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