The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Mar. 29, 2019
Applicant:
Caastle, Inc., New York, NY (US);
Inventors:
Alyssa Packard, Asheville, OH (US);
Shannon Gramley, Columbus, OH (US);
Lindsey Winland, Dublin, OH (US);
Assignee:
CAASTLE, INC., New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/93 (2006.01);
U.S. Cl.
CPC ...
G01N 21/93 (2013.01); G01N 21/8803 (2013.01);
Abstract
A method of inspecting an article with a defect detection tool includes receiving one or more articles at an inspection station and inspecting one of the received one or more articles at the inspection station by evaluating the article for at least one physical defect with the defect detection tool. The defect detection tool includes a clear body including a surface element sized to correspond to the at least one physical defect in the article, and an inspection surface configured to contact a surface of the article.