The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Feb. 06, 2019
Applicant:
Bt Imaging Pty Ltd, Redfern, New South Wales, AU;
Inventors:
Thorsten Trupke, Coogee, AU;
Juergen Weber, Coogee, AU;
Assignee:
BT Imaging Pty Ltd, New South Wales, AU;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01N 21/64 (2006.01); G01N 21/95 (2006.01); G01R 31/265 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6489 (2013.01); G01N 21/6456 (2013.01); G01N 21/9501 (2013.01); G01R 31/2656 (2013.01); G01N 2021/646 (2013.01); G01N 2201/062 (2013.01);
Abstract
Methods and systems are presented for analysing semiconductor materials as they progress along a production line, using photoluminescence images acquired using line-scanning techniques. The photoluminescence images can be analysed to obtain spatially resolved information on one or more properties of said material, such as lateral charge carrier transport, defects and the presence of cracks. In one preferred embodiment the methods and systems are used to obtain series resistance images of silicon photovoltaic cells without making electrical contact with the sample cell.