The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Jul. 05, 2018
Samsung Electronics Co., Ltd., Suwon-si, KR;
Korea University Research and Business Foundation, Seoul, KR;
Joon Hyung Lee, Seongnam-si, KR;
Beop Min Kim, Seoul, KR;
Jung Yong Nam, Hwaseong-si, KR;
Ki Young Chang, Yongin-si, KR;
Zephaniah Phillips, V, Seoul, KR;
Seung Ho Paik, Seongnam-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Korea University Research and Business Foundation, Seoul, KR;
Abstract
A photodetector selection apparatus and method and a scattering coefficient measurement apparatus and method are provided. The photodetector selection apparatus for measuring a scattering coefficient may include: a light source configured to emit light to a subject; a photodetector array configured to detect the light that is reflected or scattered from the subject and measure a light intensity of the detected light; and a processor configured to select at least one photodetector from a plurality of photodetectors of the photodetector array, based on a change in the measured light intensity of each of the plurality of photodetectors according to a change in a scattering coefficient of the subject, and determine the scattering coefficient of the subject based on the light intensity that is measured by the selected at least one photodetector.