The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Dec. 22, 2015
Hilti Aktiengesellschaft, Schaan, LI;
Torsten Gogolla, Schaan, LI;
Dietmar Schoenbeck, Goefis, AT;
Sascha Korl, Louisville, CO (US);
Jens Neumann, Grabs, CH;
Hilti Aktiengesellschaft, Schaan, LI;
Abstract
A method for examining object properties of an object in a substrate, using an arrangement that comprises a detector device, a localization device, and a control device is provided. The method includes selecting a first object having first object properties to be examined and first target coordinates and also includes determining an actual position of the detector device using the localization device. Moreover, the method includes determining by the control device an actual detection field from the actual position of the detector device, and comparing by the control device the first target coordinates with the actual detection field of the detector device.