The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
May. 23, 2017
Safran Vectronix Ag, Heerbrugg, CH;
Ivo Annen, Schindellegi, CH;
Silvio Gnepf, Heerbrugg, CH;
Safran Vectronix AG, Heerbrugg, CH;
Abstract
Disclosed is an optoelectronic measuring device having an electronic magnetic compass for determining an azimuthal alignment of the measuring device and a compensation unit, which is associated with the magnetic compass, for compensating for device-fixed interference fields, wherein the measuring device assumes at least two defined, repeatable operating states, has a different device-fixed interference field in each of the operating states, and the compensation unit carries out an initial compensation of the electronic magnetic compass in a first operating state of the measuring device, wherein the compensation unit has a detection unit for detecting a present operating state, a memory unit for storing a magnetic offset resulting from the different device-fixed interference fields between the first and a second operating state of the measuring device, and a computer unit for computing the azimuthal alignment of the measuring device depending on an ascertained operating state and based on the magnetic offset.