The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Apr. 10, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Minoru Nakamura, Yamanashi, JP;

Yoshinori Murakami, Yamanashi, JP;

Yuuki Takahashi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); B23K 26/03 (2006.01); B23K 26/08 (2014.01); B23K 26/38 (2014.01); B23K 26/21 (2014.01); B23K 26/082 (2014.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); B23K 26/032 (2013.01); B23K 26/082 (2015.10); B23K 26/0853 (2013.01); B23K 26/0869 (2013.01); B23K 26/0884 (2013.01); B23K 26/21 (2015.10); B23K 26/38 (2013.01);
Abstract

A laser processing system having a measurement function. The laser processing system includes a processing head configured to irradiate an object with a laser beam in a scanning manner via an optical system for processing; an illumination-light emitting section provided in the processing head, and configured to cause illumination light to be emitted from the processing head toward the object along an optical axis of the optical system for processing; a light receiving section located in a predetermined positional relationship with the illumination-light emitting section, and configured to receive a reflection of the illumination light reflected at an irradiated point on the object; and a measurement section configured to process the reflection received by the light receiving section and obtain three-dimensional measurement data of the irradiated point.


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