The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Jul. 25, 2016
Applicant:

Illinois Tool Works Inc., Glenview, IL (US);

Inventors:

Christian J. Hoehl, Over-Rambstadt, DE;

Martin A. Peterson, Wrentham, MA (US);

Roy D. Allen, North Andover, MA (US);

Assignee:

ILLINOIS TOOL WORKS INC., Glenview, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01); G02B 27/10 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01B 11/16 (2013.01); G02B 27/10 (2013.01); G06T 7/0004 (2013.01); G06T 7/97 (2017.01);
Abstract

The present disclosure provides an apparatus and method which uses a field splitter or a beam splitter for the purpose combining two different views of a materials testing sample under materials testing into a single image. This allows for three-dimensional strain measurement in the context of material/compound testing. In particular, the time and stress dependent change in gauge length can be tracked and calculated in order to calculate the time and stress dependent strain. The method and apparatus allows imaging on a single image sensor for the three-dimensional strain calculation.


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