The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Mar. 06, 2017
General Electric Company, Schenectady, NY (US);
Bryan J. Germann, Greenville, SC (US);
Gregory Lee Hovis, Martinez, GA (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method of monitoring a component includes providing the component which includes a body having an exterior surface and a plurality of passive strain indicators configured on the exterior surface. The method includes directly measuring the component with at least one three-dimensional data acquisition device. The direct measurement generates a first point cloud and a plurality of second point clouds. The first point cloud corresponds to the exterior surface and includes a plurality of first data points, each data point having an X-axis coordinate, a Y-axis coordinate, and a Z-axis coordinate. Each second point cloud corresponds to one of the plurality of passive strain indicators and includes a plurality of second data points, each data point having an X-axis coordinate, a Y-axis coordinate, and a Z-axis coordinate. A second data point density of each second point cloud is greater than a first data point density of each first point cloud.