The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Dec. 21, 2016
Applicant:

Kennametal Inc., Latrobe, PA (US);

Inventors:

Naveen Kumar Kondameedi, Latrobe, PA (US);

Christoph Gey, Ligonier, PA (US);

Assignee:

KENNAMETAL INC., Latrobe, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); B23B 27/14 (2006.01); B23K 101/34 (2006.01); B23K 103/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0616 (2013.01); B23B 27/14 (2013.01); B23B 2228/105 (2013.01); B23K 2101/35 (2018.08); B23K 2103/166 (2018.08);
Abstract

A method for non-destructive testing a cutting insert to determine coating thickness id disclosed. The method includes the steps of using a source of electromagnetic energy to ablate a surface of the cutting insert to non-destructively form a geometric feature and expose the substrate and each layer of the coating; and measuring the thickness of each layer of the coating. In one example, the geometric feature is a groove with a generally trapezoidal shape. In other examples, the groove can have a U-shape, V-shape, and the like. The thickness of each layer of the coating is determined using focus variation, contrast detection, confocal microscopy, an interferometric microscopy, an imaging interferometric microscopy, or similar technique.


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